Composition depth profile analysis of bulk heterojunction layer by time-of-flight secondary ion mass spectrometry with gradient shaving preparation

Thin Solid Films

Volumn 518, Issue 8, 2010, Pages 2115-2118

  Yamamoto, Shuhei ^a   Kitazawa, Daisuke ^a   Tsukamoto, Jun ^a   Shibamori, Takahiro ^b   Seki, Hirofumi ^b   Nakagawa, Yoshitsugu ^b  

^a TORAY INDUSTRIES INC   (Japan)

^b TORAY RESEARCH CENTER INC   (Japan)

Author keywords

Bulk heterojunction; Depth profile; Organic solar cells; Spectrometry; Time of flight secondary ion mass

Indexed keywords

BULK HETEROJUNCTION; DEPTH PROFILE; ORGANIC SOLAR CELL; ORGANIC SOLAR CELLS; SECONDARY IONS; TIME OF FLIGHT;

ESTERS; IONS; MASS SPECTROMETERS; SECONDARY EMISSION; SECONDARY ION MASS SPECTROMETRY; SOLAR CELLS; SPECTROMETRY;

HETEROJUNCTIONS;

EID: 73949093679     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2009.07.121     Document Type: Article

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