Grain and crystallite size evaluation of cryomilled pure copper

Journal of Alloys and Compounds

Volumn 509, Issue SUPPL. 1, 2011, Pages

  Khoshkhoo, M Samadi ^a   Scudino, S ^a   Thomas, J ^a   Surreddi, K B ^a   Eckert, J ^a,b  

^a IFW DRESDEN   (Germany)

^b DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

Mechanical alloying; Nanostructured materials; Transmission electron microscopy, TEM; X ray diffraction

Indexed keywords

CRYOGENIC TEMPERATURES; GRAIN SIZE; NANO-STRUCTURED; PLANAR FAULT; PURE COPPER; STRAIN ANISOTROPIES; WILLIAMSON-HALL; X-RAY LINE PROFILE ANALYSIS;

COHERENT SCATTERING; DIFFRACTION; MECHANICAL ALLOYING; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

CRYSTALLITE SIZE;

EID: 79958146706     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2011.02.066     Document Type: Conference Paper

References (20)

1. H. Gleiter Prog. Mater. Sci. 33 1989 223 315
2. J. Eckert, J.C. Holzer, C.E. Krill III, and W.L. Johnson J. Mater. Res. 7 1992 1751
3. C.C Koch Nanostructured Materials: Processing, Properties and Potential Applications 2002 Noyes Publications, William Andrew Publishing Norwich NY
4. J. Guerrero-Paz, and D. Jaramillo-Vigueras Nanostruct. Mater. 11 1999 1195
5. Y. Zhong, D.H. Ping, X.Y. Song, and F.X. Yin J. Alloys Compd. 476 2009 113
6. A. Dubravina, M.J. Zehetbauer, E. Schafler, and I.V. Alexandrov Mater. Sci. Eng. A 387-389 2004 817
7. E. Schafler, G. Steiner, E. Korznikova, M. Kerber, and M.J. Zehetbauer Mater. Sci. Eng. A 410-411 2005 169
8. G.K. Williamson, and W.H. Hall. Acta Metall. 1 1953 22
9. H.M. Rietveld J. Appl. Crystallogr. 2 1969 65
10. E. Schafler, and M. Zehetbauer Rev. Adv. Mater. Sci. 10 2005 28
11. J.H. Oh, E.H. Kim, D.H. Kang, J. h. Cheon, K.H. Kim, and J. Jang Thin Solid Films 515 2007 5054
12. T. Ungár, G. Tichy, J. Gubicza, and R.J. Hellmig Powder Diffr. 20 2005 366
13. T. Ungár, and A. Borbély Appl. Phys. Lett. 69 1996 3173
14. T. Ungár, Á. Révész, and A. Borbély J. Appl. Crystallogr. 31 1998 554
15. M.S. Paterson J. Appl. Phys. 23 1952 805
16. B.E. Warren Prog. Met. Phys. 8 1959 147
17. T. Ungár, S. Ott, P.G. Sanders, A. Borbély, and J.R. Weertman Acta Mater. 46 1998 3693
18. J.I. Langford, D. Louer, and P. Scardi J. Appl. Crystallogr. 33 2000 964
19. D.B. Williams, and C.B. Carter Transmission Electron Microscopy: A Textbook for Materials Science 1997 Plenum Publishing Corporation New York
20. S. Gomari, and S. Sharafi J. Alloys Compd. 490 2010 26