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Volumn 476, Issue 1-2, 2009, Pages 113-117

Determination of grain size by XRD profile analysis and TEM counting in nano-structured Cu

Author keywords

Grain size; Sparkle plasma sintering (SPS); Substructure; Transmission electronic microscope (TEM); X ray diffraction (XRD)

Indexed keywords

ANNEAL TREATMENTS; ANNEALED SAMPLES; CUT OFFS; GRAIN SIZE; GRAIN SIZE DISTRIBUTIONS; LARGE GRAINS; MICRO-SCALE; NANO-CRYSTALLINE; NANO-SCALE; NANO-STRUCTURED; PHYSICAL MEANINGS; PROFILE ANALYSIS; PURE COPPERS; SPARKLE PLASMA SINTERING (SPS); SUBSTRUCTURE; X-RAY DIFFRACTION (XRD); XRD; XRD ANALYSIS;

EID: 64549142869     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2008.08.075     Document Type: Article
Times cited : (88)

References (29)
  • 29
    • 0000041764 scopus 로고
    • Simmons J.A., de Witt R., and Bullough R. (Eds), NBS Spec. Publ. 317
    • Wilkens M. In: Simmons J.A., de Witt R., and Bullough R. (Eds). Fundamental Aspects of Dislocation Theory (1970), NBS Spec. Publ. 317 1195-1221
    • (1970) Fundamental Aspects of Dislocation Theory , pp. 1195-1221
    • Wilkens, M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.