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Volumn 476, Issue 1-2, 2009, Pages 113-117
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Determination of grain size by XRD profile analysis and TEM counting in nano-structured Cu
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Author keywords
Grain size; Sparkle plasma sintering (SPS); Substructure; Transmission electronic microscope (TEM); X ray diffraction (XRD)
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Indexed keywords
ANNEAL TREATMENTS;
ANNEALED SAMPLES;
CUT OFFS;
GRAIN SIZE;
GRAIN SIZE DISTRIBUTIONS;
LARGE GRAINS;
MICRO-SCALE;
NANO-CRYSTALLINE;
NANO-SCALE;
NANO-STRUCTURED;
PHYSICAL MEANINGS;
PROFILE ANALYSIS;
PURE COPPERS;
SPARKLE PLASMA SINTERING (SPS);
SUBSTRUCTURE;
X-RAY DIFFRACTION (XRD);
XRD;
XRD ANALYSIS;
ANNEALING;
DIFFRACTION;
GRAIN SIZE AND SHAPE;
MICROSCOPES;
PLASMA DIAGNOSTICS;
PLASMAS;
SINTERING;
SIZE DISTRIBUTION;
X RAY DIFFRACTION;
X RAY DIFFRACTION ANALYSIS;
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EID: 64549142869
PISSN: 09258388
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jallcom.2008.08.075 Document Type: Article |
Times cited : (88)
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References (29)
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