Characterization of nanostructured materials by X-ray Line Profile Analysis

Reviews on Advanced Materials Science

Volumn 10, Issue 1, 2005, Pages 28-33

  Schafler, E ^a   Zehetbauer, M ^a  

^a UNIVERSITY OF VIENNA   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION; CRYSTAL DEFECTS; CRYSTAL LATTICES; CRYSTAL MICROSTRUCTURE; CRYSTAL STRUCTURE; DENSITY (SPECIFIC GRAVITY); POWDERS; PROFILOMETRY; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY; X RAY ANALYSIS;

LATTICE DEFECT DENSITIES; LOOSE POWDER MATERIALS; STRUCTURAL SIZE; X-RAY LINE PROFILE ANALYSIS (XPA);

NANOSTRUCTURED MATERIALS;

EID: 23944458207     PISSN: 16065131     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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