Stochastic circuit reliability analysis

Proceedings -Design, Automation and Test in Europe, DATE

Volumn , Issue , 2011, Pages 1285-1290

  Maricau, Elie ^a   Gielen, Georges ^a  

^a UNIVERSITY OF LEUVEN   (Belgium)

Author keywords

Aging; Design for Reliability; Failure Resilience; HBD; Hot Carrier Degradation; NBTI; SBD; TDDB

Indexed keywords

AGING; DESIGN FOR RELIABILITY; FAILURE-RESILIENCE; HBD; HOT CARRIER DEGRADATION; NBTI; SBD; TDDB;

COMPUTER SIMULATION; DESIGN; ELECTRIC NETWORK ANALYSIS; HOT CARRIERS; INTEGRATED CIRCUITS; RELIABILITY ANALYSIS; STOCHASTIC SYSTEMS;

SPICE;

EID: 79957546177     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (13)

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