Perforated tips for high-resolution in-plane magnetic force microscopy

Applied Physics Letters

Volumn 76, Issue 7, 2000, Pages 909-911

  Folks, L ^a   Best, M E ^a   Rice, P M ^a   Terris, B D ^a   Weller, D ^a   Chapman, J N ^b  

^a IBM ALMADEN RESEARCH CENTER   (United States)

^b UNIVERSITY OF GLASGOW   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001359535     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.125626     Document Type: Article

References (13)

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