SCOPUS 정보 검색 플랫폼

Volumn 190, Issue 1-2, 1998, Pages 135-147

Comparing the resolution of magnetic force microscopes using the CAMST reference samples

i NONE

Author keywords

Fourier analysis; Low temperature; Magnetic force microscopy; Magneto optic; Resolution; Vacuum

Indexed keywords

COBALT ALLOYS; MAGNETIC STORAGE; MAGNETOOPTICAL DEVICES; MICROSCOPES; MULTILAYERS;

MAGNETIC FORCE MICROSCOPES;

MAGNETIC MEASURING INSTRUMENTS;

EID: 0032296423 PISSN: 03048853 EISSN: None Source Type: Journal
DOI: 10.1016/S0304-8853(98)00281-9 Document Type: Article

Times cited : (48)

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