High-resolution surface charge image achieved by a multiforce sensor based on a quartz tuning fork in electrostatic force microscope

Applied Physics Letters

Volumn 81, Issue 7, 2002, Pages 1300-1302

  Wang, Zhi Yong ^a   Bao, Jian Bin ^a   Zhang, Hong Hai ^a   Guo, Wen Ming ^a  

^a HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROSTATIC FORCE MICROSCOPES; HIGH RESOLUTION; HIGH SPATIAL RESOLUTION; MICROTIPS; MULTI-FORCE SENSORS; NEEDLE SENSORS; NON-CONTACT MODE; QUARTZ TUNING FORK; TUNGSTEN TIP; TUNING FORKS;

ELECTROSTATIC DEVICES; FIELD EFFECT TRANSISTORS; QUARTZ; SENSORS; SURFACE TOPOGRAPHY; TUNGSTEN; TUNING; VAN DER WAALS FORCES;

ELECTROSTATIC FORCE;

EID: 79956013731     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1500779     Document Type: Article

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