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Volumn 81, Issue 6, 2002, Pages 1104-1106

Single-crystal Si formed on amorphous substrate at low temperature by nanopatterning and nickel-induced lateral crystallization

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS SILICON FILM; AMORPHOUS SUBSTRATE; CRYSTALLIZATION PROCESS; IN-SITU TRANSMISSION; LOW TEMPERATURES; MULTIPLE GRAINS; NANO SCALE; NANOPATTERNING; NARROW-LINE WIDTH; SILICONDIOXIDE SUBSTRATES; SINGLE CRYSTAL SILICON; SINGLE-CRYSTAL SI;

EID: 79955995368     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1498146     Document Type: Article
Times cited : (10)

References (16)
  • 4
    • 79958232507 scopus 로고    scopus 로고
    • note
    • In AMLCD application, glass substrate is usually used, which has a strain point around 600°C; for 3D integrated circuits application, substrate temperature below 850°C is often wanted to ensure the stableness of underlying devices.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.