Thermoelectric measurements using different tips in atomic force microscopy

Journal of Applied Physics

Volumn 109, Issue 8, 2011, Pages

  Kushvaha, S S ^a   Hofbauer, W ^a   Loke, Y C ^a   Singh, Samarendra P ^a   O'Shea, S J ^a  

^a INSTITUTE OF MATERIALS RESEARCH AND ENGINEERING   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

AFM; COATED TIPS; CONDUCTING ATOMIC FORCE MICROSCOPY; DIAMOND MATERIALS; DIAMOND TIP; DOPED-DIAMOND FILMS; ELECTRICAL TRANSPORT; LOWEST UNOCCUPIED MOLECULAR ORBITAL; METAL JUNCTIONS; METAL SAMPLES; ORGANIC THIN FILMS; PERYLENE TETRACARBOXYLIC; PT FILMS; QUANTITATIVE ANALYSIS; THERMOELECTRIC MEASUREMENTS; THERMOPOWERS; THERMOVOLTAGE;

ATOMIC FORCE MICROSCOPY; CONDUCTIVE FILMS; DIAMOND FILMS; DIAMONDS; GOLD COATINGS; MOLECULAR ORBITALS; PLATINUM; THERMOELECTRIC POWER;

GOLD;

EID: 79955725058     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3581073     Document Type: Article

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