Thermopower profiling of a silicon p-n junction

Applied Physics Letters

Volumn 90, Issue 4, 2007, Pages

  Kim, Kyeongtae ^a   Park, Jisang ^a   Kim, Sun Ung ^a   Kwon, Ohmyoung ^a   Lee, Joon Sik ^b   Park, Seungho Ho ^c   Choi, Young Ki ^d  

^a Korea University   (South Korea)

^b Seoul National University   (South Korea)

^c Hong Ik University   (South Korea)

^d Chung Ang University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

MEASUREMENT THEORY; PHOTOIONIZATION; THERMAL EFFECTS;

THERMOPOWER DISTRIBUTION; THERMOPOWER MEASUREMENT TECHNIQUES; THERMOPOWER PROFILING;

SEMICONDUCTOR JUNCTIONS;

EID: 33846566890     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2432949     Document Type: Article

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