Structural and optical properties of YSZ thin films grown by PLD technique

Applied Surface Science

Volumn 257, Issue 15, 2011, Pages 6833-6836

  Pandey, S K ^a   Thakur, O P ^a   Raman, R ^a   Goyal, Anshu ^a   Gupta, Amita ^a  

^a SOLID STATE PHYSICS LABORATORY   (India)

Author keywords

Band gap; Laser ablation; Thin films; YSZ

Indexed keywords

ENERGY GAP; LASER ABLATION; OPTICAL PROPERTIES; PULSED LASER DEPOSITION; PULSED LASERS; SOLID STATE REACTIONS; SUBSTRATES; SURFACE ROUGHNESS; YTTRIA STABILIZED ZIRCONIA; YTTRIUM OXIDE; ZIRCONIA;

DEPOSITION TEMPERATURES; PREFERRED ORIENTATIONS; SOLID STATE REACTION METHOD; STRUCTURAL AND OPTICAL PROPERTIES; THIN-FILM DEPOSITIONS; TRANSMITTANCE CURVES; UV-VIS-NIR SPECTROPHOTOMETERS; YTTRIA-STABILIZED ZIRCONIA THIN FILMS;

THIN FILMS;

EID: 79954577470     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2011.03.008     Document Type: Article

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