Properties of YSZ thin films deposited by e-beam technique

Solid State Ionics

Volumn 179, Issue 1-6, 2008, Pages 182-187

  Laukaitis, G ^a   Dudonis, J ^a   Orliukas, A F ^b   Milcius, D ^c  

^a KAUNAS UNIVERSITY OF TECHNOLOGY   (Lithuania)

^b VILNIUS UNIVERSITY   (Lithuania)

^c LITHUANIAN ENERGY INSTITUTE   (Lithuania)

Author keywords

Electron beam deposition; Ionic conductivity; Solid oxide fuel cells (SOFC); YSZ thin films

Indexed keywords

ELECTRON BEAMS; ELECTRON GUNS; IONIC CONDUCTIVITY; SOLID OXIDE FUEL CELLS (SOFC); SURFACE MORPHOLOGY; YTTRIUM COMPOUNDS;

DEPOSITION PARAMETERS; E-BEAM TECHNIQUE; ELECTRON BEAM DEPOSITION; YSZ THIN FILMS;

THIN FILMS;

EID: 40249119674     PISSN: 01672738     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ssi.2007.12.030     Document Type: Article

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