A dual analyzer for real-time impedance and noise spectroscopy of nanoscale devices

Review of Scientific Instruments

Volumn 82, Issue 3, 2011, Pages

  Joo, Min Kyu ^a,b   Kang, Pilsoo ^a,b   Kim, Yongha ^a   Kim, Gyu Tae ^a   Kim, Sangtae ^b  

^a Korea University   (South Korea)

^b University of California Davis   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AC-IMPEDANCE; DATA ACQUISITION SYSTEM; DC BIAS; ELECTRICAL NOISE; FREQUENCY COMPONENTS; INPUT SIGNAL; LOW NOISE; NANOSCALE DEVICE; NOISE SPECTROSCOPY; NYQUIST PLOTS; SINGLE-WALLED CARBON NANOTUBE FIELD EFFECT TRANSISTORS; SINUSOIDAL VOLTAGE; VOLTAGE PREAMPLIFIER;

CARBON NANOTUBES; DC POWER TRANSMISSION; FIELD EFFECT TRANSISTORS; FREQUENCY RESPONSE; MESFET DEVICES; SINGLE-WALLED CARBON NANOTUBES (SWCN); SPECTROSCOPIC ANALYSIS;

REAL TIME SYSTEMS;

ARTICLE; ELECTROCHEMICAL IMPEDANCE SPECTROSCOPY; INSTRUMENTATION; NANOTECHNOLOGY; SEMICONDUCTOR; TIME;

DIELECTRIC SPECTROSCOPY; NANOTECHNOLOGY; TIME FACTORS; TRANSISTORS, ELECTRONIC;

EID: 79953654021     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3553208     Document Type: Article

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