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Volumn 27, Issue 7, 2011, Pages 3283-3285

Insight into on-wafer crystallization of pure-silica-zeolite films through nutrient replenishment

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLINE DOMAINS; ELLIPSOMETRIC POROSIMETRY; FILM MICROSTRUCTURES; LOW DIELECTRIC CONSTANTS; MEAN PORE SIZE; MESOPORE SIZES; NANOPARTICLE SUSPENSION; ON-WAFER; PURE SILICA ZEOLITES; REDUCED MODULUS; SPIN-ON; TEM; TETRAETHYL ORTHOSILICATES;

EID: 79953251289     PISSN: 07437463     EISSN: 15205827     Source Type: Journal    
DOI: 10.1021/la200603z     Document Type: Article
Times cited : (3)

References (17)
  • 1
    • 79953243282 scopus 로고    scopus 로고
    • International Technology Roadmap for Semiconductors 2009 Edition - Interconnect. (September 11).
    • International Technology Roadmap for Semiconductors 2009 Edition-Interconnect. http://www.itrs.net/Links/2009ITRS/2009Chapters- 2009Tables/2009-Interconnect.pdf (September 11, 2010).
    • (2010)
  • 2
    • 84950317098 scopus 로고    scopus 로고
    • Spin-on Dielectric Materials
    • Baklanov M.R., Green M., Maex K. Eds.; John Wiley and Sons, Ltd.: West Sussex, Great Britain
    • Dubois, G.; Miller, R. D.; Volksen, W. Spin-on Dielectric Materials. In Dielectric Films for Advanced Microelectronics; Baklanov, M. R., Green, M., Maex, K., Eds.; John Wiley and Sons, Ltd.: West Sussex, Great Britain, 2007; pp 33 - 83.
    • (2007) Dielectric Films for Advanced Microelectronics , pp. 33-83
    • Dubois, G.1    Miller, R.D.2    Volksen, W.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.