Erratum: X-ray wavefront analysis and optics characterization with a grating interferometer (Applied Physics Letters (2005) 86 (054101))

Applied Physics Letters

Volumn 86, Issue 11, 2005, Pages 1-

  Weitkamp, Timm ^a   Nöhammer, Bernd ^a   Diaz, Ana ^a   David, Christian ^a   Ziegler, Eric ^b  

^a PAUL SCHERRER INSTITUTE   (Switzerland)

^b EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 17944362788     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1882745     Document Type: Erratum

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