Ultrahigh density alignment of carbon nanotube arrays by dielectrophoresis

ACS Nano

Volumn 5, Issue 3, 2011, Pages 1739-1746

  Shekhar, Shashank ^a   Stokes, Paul ^a   Khondaker, Saiful I ^a,b  

^a UNIVERSITY OF CENTRAL FLORIDA   (United States)

^b University of Central Florida   (United States)

Author keywords

array; carbon nanotube; directed assembly; solution processed

Indexed keywords

AC DIELECTROPHORESIS; ALIGNED ARRAYS; ALIGNED SINGLE-WALLED CARBON NANOTUBES; ANALOG ELECTRONICS; ARRAY; CARBON NANOTUBE ARRAY; CHANNEL LENGTH; DENSE ARRAYS; DIELECTROPHORESIS; DIRECTED ASSEMBLY; ELECTRICAL BREAKDOWN; ELECTRICAL MEASUREMENT; HIGH CURRENTS; HIGH QUALITY; LINEAR DENSITY; MAXIMUM DENSITY; MULTIPLE LAYERS; ON-OFF RATIO; SELECTIVE REMOVAL; SOLUTION PROCESSED; SOLUTION-PROCESSING; SURFACTANT-FREE; TRAPPING TIME; TWO-DIMENSIONAL ARRAYS; ULTRAHIGH DENSITY;

ALIGNMENT; DIGITAL DEVICES; ELECTRIC RESISTANCE; ELECTROPHORESIS; FIELD EFFECT TRANSISTORS; SURFACE ACTIVE AGENTS;

SINGLE-WALLED CARBON NANOTUBES (SWCN);

CARBON NANOTUBE;

ARTICLE; CHEMISTRY; CONFORMATION; CRYSTALLIZATION; ELECTROPHORESIS; ELECTROPLATING INDUSTRY; EQUIPMENT; EQUIPMENT DESIGN; INSTRUMENTATION; MACROMOLECULE; MATERIALS TESTING; METHODOLOGY; NANOTECHNOLOGY; PARTICLE SIZE; SEMICONDUCTOR; SURFACE PROPERTY; ULTRASTRUCTURE;

CRYSTALLIZATION; ELECTROPHORESIS; ELECTROPLATING; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; MACROMOLECULAR SUBSTANCES; MATERIALS TESTING; MOLECULAR CONFORMATION; NANOTECHNOLOGY; NANOTUBES, CARBON; PARTICLE SIZE; SURFACE PROPERTIES; TRANSISTORS, ELECTRONIC;

EID: 79952920974     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/nn102305z     Document Type: Article

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