Ultra-large-scale directed assembly of single-walled carbon nanotube devices

Nano Letters

Volumn 7, Issue 6, 2007, Pages 1556-1560

  Vijayaraghavan, Aravind ^a   Blatt, Sabine ^a   Weissenberger, Daniel ^b   Oron Carl, Matti ^a   Hennrich, Frank ^a   Gerthsen, Dagmar ^b   Hahn, Horst ^a   Krupke, Ralph ^a  

^a KARLSRUHE INSTITUTE OF TECHNOLOGY   (Germany)

^b UNIVERSITY OF KARLSRUHE   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELD EFFECTS; ELECTROPHORESIS; FABRICATION; MICROPROCESSOR CHIPS;

CONTACT AREAS; MICROPROBES; NANOTUBE DIELECTROPHORESIS; SINGLE-NANOTUBE DEVICES;

SINGLE-WALLED CARBON NANOTUBES (SWCN);

CARBON NANOTUBE;

ARTICLE; CHEMISTRY; CONFORMATION; CRYSTALLIZATION; ELECTRIC CONDUCTIVITY; ELECTRON TRANSPORT; EQUIPMENT; EQUIPMENT DESIGN; EVALUATION; MACROMOLECULE; MATERIALS TESTING; METHODOLOGY; MICROELECTRODE; NANOTECHNOLOGY; PARTICLE SIZE; SURFACE PROPERTY; ULTRASTRUCTURE;

CRYSTALLIZATION; ELECTRIC CONDUCTIVITY; ELECTRON TRANSPORT; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; MACROMOLECULAR SUBSTANCES; MATERIALS TESTING; MICROELECTRODES; MOLECULAR CONFORMATION; NANOTECHNOLOGY; NANOTUBES, CARBON; PARTICLE SIZE; SURFACE PROPERTIES;

EID: 34547362208     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl0703727     Document Type: Article

References (25)

1. Tans, S. J.; Devoret, M. H.; Dai, H.; Thess, A.; Smalley, R. E.; Geerligs, L. J.; Dekker, C. Nature 1997, 386, 474.
2. Nygard, J.; Cobden, D. H.; Bockrath, M.; McEuen, P. L.; Lindelof, P. E. Appl. Phys. A 1999, 69, 297.
3. Wei, B. Q.; Vajtai, R.; Ajayan, P. M. Appl. Phys. Lett. 2001, 79, 1172.
4. Avouris, P. Acc. Chem. Res. 2002, 35, 1026.
5. Bockrath, M.; Cobden, D. H.; McEuen, P. L.; Chopra, N. G.; Zettl, A.; Thess, A.; Smalley, R. E. Science 1997, 275, 1922.
6. Kociak, M.; Kasumov, A. Y.; Guéron, S.; Reulet, B.; Khodos, I. I.; Gorbatov, Y. B.; Volkov, V. T.; Vaccarini, L.; Bouchiat, H. Phys. Rev. Lett. 2001, 86, 2416-2419.
7. McEuen, P. L.; Fuhrer, M. S.; Park, H. IEEE Trans. Nanotechnol. 2002, 1, 78.
8. Zhang, Y.; Chang, A.; Cao, J.; Wang, Q.; Kim, W.; Li, Y.; Morris, N.; Yenilmez, E.; Kong, J.; Dai, H. Appl. Phys. Lett. 2001, 79, 3155.
9. Rao, S. G.; Huang, L.; Setyawan, W.; Hong, S. Nature 2003, 425, 36.
10. Krupke, R.; Hennrich, F.; Weber, H. B.; Beckmann, D.; Hampe, O.; Malik, S.; Kappes, M. M.; Lohneysen, H. v. Appl. Phys. A 2003, 76, 397-400.
11. Krupke, R.; Hennrich, F.; Weber, H. B.; Kappes, M. M.; Lohneysen, H. v. Nano Lett. 2003, 3, 1019-1023.
12. Chung, J.; Lee, K.-H.; Lee, J.; Ruoff, R. S. Langmuir 2004, 20, 3011-3017.
13. Liu, Y.; Chung, J.-H.; Liu, W. K.; Ruoff, R. S. J. Phys. Chem. B 2006, 110, 14098-14106.
14. Andriotis, A. N.; Menon, M.; Froudakis, G. Appl. Phys. Lett. 2000, 76.
15. Chen, Z.; Appenzeller, J.; Knoch, J.; Lin, Y.; Avouris, P. Nano Lett. 2005, 5, 1497.
16. Krupke, R.; Hennrich, F.; Kappes, M. M.; Lohneysen, H. v. Nano Lett. 2004, 4, 1395-1399.
17. Marquardt, C. W.; Blatt, S.; Hennrich, F.; Löhneysen, H. V.; Krupke, R. Appl. Phys. Lett. 2006, 89, 183117.
18. Oron-Carl, M.; Hennrich, F.; Kappes, M. M.; Lohneysen, H. v.; Krupke, R. Nano Lett. 2005, 5, 1761-1767.
19. Mann, D.; Javey, A.; Kong, J.; Wang, Q.; Dai, H. Nano Lett. 2003, 3, 1541.
20. Heller, D. A.; Mayrhofer, R. M.; Baik, S.; Grinkova, Y. V.; Usrey, M. L.; Strano, M. S. J. Am. Chem. Soc. 2004, 126, 14567-14573.
21. Arnold, M. S.; Green, A. A.; Hulvat, J. F.; Stupp, S. I.; Hersam, M. C. Nat. Nanotechnol. 2006, 1, 60-65.
22. Krupke, R.; Hennrich, F. Adv. Eng. Mater. 2005, 7, 111-116.
23. Lastella, S.; Mallick, G.; Woo, R.; Karna, S. P.; Rider, D. A.; Manners, I.; Jung, Y. J.; Ryu, C. Y.; Ajayan, P. M. J. Appl. Phys. 2006, 99, 024302.
24. Javey, A.; Wang, Q.; Ural, A.; Li, Y.; Dai, H. Nano Lett. 2002, 2, 929-932.
25. Homma, Y.; Suzuki, S.; Kobayashi, Y; Nagase, M.; Takagi, D. Appl. Phys. Lett. 2004, 84, 1750-1752.