Thickness-dependent fcc-hcp phase transformation in polycrystalline titanium thin films

Acta Materialia

Volumn 59, Issue 7, 2011, Pages 2615-2623

  Chakraborty, J ^a   Kumar, Kishor ^b   Ranjan, Rajeev ^c   Chowdhury, S Ghosh ^a   Singh, S R ^a  

^a NATIONAL METALLURGICAL LABORATORY   (India)

^b INSTITUTE FOR PLASMA RESEARCH   (India)

^c INDIAN INSTITUTE OF SCIENCE   (India)

Author keywords

Phase transformation; Stress; Texture; X ray diffraction

Indexed keywords

CRYSTALLOGRAPHIC TEXTURES; FACE-CENTERED CUBIC; FCC PHASE; FCC STRUCTURES; FCC--HCP TRANSFORMATION; HCP STRUCTURE; HEXAGONAL CLOSE-PACKED; MATRIX; PHASE TRANSFORMATION; POLYCRYSTALLINE; POLYCRYSTALLINE TITANIUM; THICKNESS REGIME; TI FILM; TI THIN FILMS; TOTAL FREE ENERGY;

DIFFRACTION; STRESS ANALYSIS; TEXTURES; THIN FILMS; TITANIUM; X RAY DIFFRACTION;

PHASE TRANSITIONS;

EID: 79952332532     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2010.12.046     Document Type: Article

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