Stress, texture and microstructure of zirconium thin films probed by X-ray diffraction

Thin Solid Films

Volumn 516, Issue 23, 2008, Pages 8479-8486

  Chakraborty, J ^a   Kumar, K Kishor ^a   Mukherjee, S ^a   Ray, S K ^b  

^a INSTITUTE FOR PLASMA RESEARCH   (India)

^b INDIAN INSTITUTE OF TECHNOLOGY   (India)

Author keywords

Stress; Texture; X ray diffraction; Zirconium

Indexed keywords

DIFFRACTION; ICE; TEXTURES; THICK FILMS; THIN FILMS; X RAY ANALYSIS; X RAY DIFFRACTION; ZIRCONIUM;

STRESS; TEXTURE;

MAGNETRON SPUTTERING;

EID: 51149114815     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2008.04.096     Document Type: Article

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