Dependence of BiFeO3 thickness on exchange bias in BiFeO 3/ Co2FeAl multiferroic structures

Journal of Physics: Conference Series

Volumn 263, Issue 1, 2011, Pages

  Zhang, X ^a   Zhang, D L ^a   Wang, Y H ^a   Miao, J ^a   Xu, X G ^a   Jiang, Y ^a  

^a UNIVERSITY OF SCIENCE AND TECHNOLOGY BEIJING   (China)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON DIOXIDE; DEPOSITION; MAGNETIC MATERIALS; MODULATION; PULSED LASER DEPOSITION; THIN FILMS;

BFO FILMS; DIFFERENT THICKNESS; EXCHANGE BIAS; HALF-METALLIC; MODULATION WAVELENGTH; MULTIFERROICS;

COBALT;

EID: 79952026904     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/263/1/012008     Document Type: Conference Paper

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