Nano-patterning of graphene structures using highly focused beams of gallium ions

Materials Research Society Symposium Proceedings

Volumn 1259, Issue , 2010, Pages 47-58

  Gierak, Jacques ^a   Lucot, Damien ^a   Ouerghi, Abdelkarim ^a   Patriarche, Gilles ^a   Bourhis, Eric ^a   Faini, Giancarlo ^a   Mailly, Dominique ^a  

^a UNIV PARIS SUD   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLINITY; ELECTRONIC PROPERTIES; GALLIUM; NANORIBBONS;

FOCUSED BEAMS; HIGH CRYSTALLINITY; HIGH QUALITY; NANOPATTERNING; SUSPENDED GRAPHENE; ULTRA-THIN;

GRAPHENE;

EID: 79951980829     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-1259-s18-04     Document Type: Conference Paper

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