메뉴 건너뛰기




Volumn 3, Issue 9, 2009, Pages 2674-2676

Etching of graphene devices with a helium ion beam

Author keywords

Etching; Graphene; Helium ion microscope; Transistor

Indexed keywords

ELECTRICAL MEASUREMENT; ETCHING PROCESS; GRAPHENE; GRAPHENE DEVICES; HELIUM ION BEAMS; HELIUM ION MICROSCOPE; IN-SITU; ION DOSE; RESIDUAL CONDUCTIVITY; SILICON DIOXIDE;

EID: 70349541005     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/nn900744z     Document Type: Article
Times cited : (291)

References (19)
  • 4
    • 34547334459 scopus 로고    scopus 로고
    • Energy band-gap engineering of graphene nanoribbons
    • Han, M. Y.; Özylimaz, B.; Zhang, Y.; Kim, P. Energy Band-Gap Engineering of Graphene Nanoribbons. Phys. Rev. Lett. 2007, 98, 206805.
    • (2007) Phys. Rev. Lett. , vol.98 , pp. 206805
    • Han, M.Y.1    Özylimaz, B.2    Zhang, Y.3    Kim, P.4
  • 11
    • 65249133533 scopus 로고    scopus 로고
    • Narrow graphene nanoribbons from carbon nanotubes
    • Jiao, L.; Zhang, L.; Wang, X.; Diankov, G.; Dai, H. Narrow Graphene Nanoribbons from Carbon Nanotubes. Nature 2009, 458, 877-880.
    • (2009) Nature , vol.458 , pp. 877-880
    • Jiao, L.1    Zhang, L.2    Wang, X.3    Diankov, G.4    Dai, H.5
  • 12
    • 52349104848 scopus 로고    scopus 로고
    • Electron beam nanosculpting of suspended graphene sheets
    • Fischbein, M. D.; Drndić, M. Electron Beam Nanosculpting of Suspended Graphene Sheets. Appl. Phys. Lett. 2008, 93, 113107.
    • (2008) Appl. Phys. Lett. , vol.93 , pp. 113107
    • Fischbein, M.D.1    Drndić, M.2
  • 13
    • 35348840711 scopus 로고    scopus 로고
    • An introduction to the helium ion microscope
    • Morgan, J.; Notte, J.; Hill, R.; Ward, B. An Introduction to the Helium Ion Microscope. Microsc. Today 2006, 14, 24-31.
    • (2006) Microsc. Today , vol.14 , pp. 2
    • Morgan, J.1    Notte, J.2    Hill, R.3    Ward, B.4
  • 14
    • 58849153828 scopus 로고    scopus 로고
    • Applications of the helium ion microscope
    • Scipioni, L.; Stern, L.; Notte, J. Applications of the Helium Ion Microscope. Microsc. Today 2007, 15, 12-14.
    • (2007) Microsc. Today , vol.15 , pp. 12-14
    • Scipioni, L.1    Stern, L.2    Notte, J.3
  • 15
    • 66349108824 scopus 로고    scopus 로고
    • Contrast mechanisms and image formation in helium ion microscopy
    • Bell, D. C. Contrast Mechanisms and Image Formation in Helium Ion Microscopy. Microsc. Microanal. 2009, 15, 147-153.
    • (2009) Microsc. Microanal , vol.15 , pp. 147-153
    • Bell, D.C.1
  • 17
    • 34547820166 scopus 로고    scopus 로고
    • Quantum hall effect in a gate-controlled p-n junction of graphene
    • Williams, J. R.; DiCarlo, L.; Marcus, C. M. Quantum Hall Effect in a Gate-Controlled p-n Junction of Graphene. Science 2007, 377, 638-641.
    • (2007) Science , vol.377 , pp. 638-641
    • Williams, J.R.1    Dicarlo, L.2    Marcus, C.M.3
  • 19
    • 49449091072 scopus 로고    scopus 로고
    • Approaching ballistic ttransport in suspended graphene
    • Du, X.; Skachko, I.; Barker, A.; Andrei, E. Y. Approaching Ballistic Ttransport in Suspended Graphene. Nat. Nanotechnol. 2008, 3, 491-495.
    • (2008) Nat. Nanotechnol , vol.3 , pp. 491-495
    • Du, X.1    Skachko, I.2    Barker, A.3    Andrei, E.Y.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.