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Applied Surface Science

Volumn 257, Issue 11, 2011, Pages 4795-4800

Studies of structural evolution and sensing properties of ZnO nanocrystalline films

(5) Peng, X Y a Sajjad, M a J chu, a Yang, B Q b Feng, P X a

a UNIVERSITY OF PUERTO RICO (Puerto Rico)

b UNIVERSITY OF MASSACHUSETTS (United States)

Author keywords

Annealing; D.C. sputtering; Gas sensor; ZnO

Indexed keywords

ANNEALING; CHEMICAL SENSORS; DEPOSITION; GAS DETECTORS; II-VI SEMICONDUCTORS; SCANNING ELECTRON MICROSCOPY; SILICON COMPOUNDS; SURFACE ROUGHNESS; THIN FILMS; X RAY DIFFRACTION; ZINC OXIDE;

CRYSTALLINE GRAINS; D.C. SPUTTERING; DEPOSITION DURATIONS; NANO-CRYSTALLINE FILMS; RAMAN SCATTERING SPECTRA; STRUCTURAL EVOLUTION; X-RAY DIFFRACTION MEASUREMENTS; ZNO NANOCRYSTALLINE FILMS;

NANOCRYSTALS;

EID: 79951678918 PISSN: 01694332 EISSN: None Source Type: Journal
DOI: 10.1016/j.apsusc.2010.12.041 Document Type: Article

Times cited : (21)

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