Evolution of resonant Raman scattering spectra of ZnO crystallites upon post-growth thermal annealing

Journal of Crystal Growth

Volumn 312, Issue 4, 2010, Pages 527-531

  Liu, H F ^a   Chua, S J ^a   Hu, G X ^b   Gong, H ^b  

^a INSTITUTE OF MATERIALS RESEARCH AND ENGINEERING   (Singapore)

^b NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

A1. Heterostructures; A3. Physical vapor deposition process; B1. ZnO; B2. Semiconductor materials

Indexed keywords

B1. ZNO; BLUE SHIFT; CRYSTAL REORIENTATION; HETEROSTRUCTURES; INTENSITY REDUCTION; NEAR-SURFACE DEFECTS; OFF-AXIS; PHOTOLUMINESCENCE MEASUREMENTS; PHYSICAL VAPOR DEPOSITION PROCESS; POSTGROWTH THERMAL ANNEALING; RADIO-FREQUENCY-MAGNETRON SPUTTERING; RED SHIFT; RESONANT RAMAN SCATTERING; SUBMICRON; SURFACE ELECTRIC FIELDS; SURFACE OPTICAL; SURFACE STATE; THERMAL-ANNEALING; ZNO;

ANNEALING; CRYSTALLITES; CRYSTALS; ELECTRIC FIELDS; HETEROJUNCTIONS; PASSIVATION; PHYSICAL VAPOR DEPOSITION; RAMAN SCATTERING; SEMICONDUCTOR GROWTH; SEMICONDUCTOR MATERIALS; SURFACES; ZINC OXIDE;

SURFACE DEFECTS;

EID: 74549143803     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2009.11.052     Document Type: Article

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