Structural degradation and optical property of nanocrystalline ZnO films grown on Si (100)

Applied Physics Letters

Volumn 92, Issue 23, 2008, Pages

  Yang, Boqian ^a   Kumar, Ashok ^a   Feng, Peter ^a   Katiyar, R S ^a  

^a UNIVERSITY OF PUERTO RICO   (Puerto Rico)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS MATERIALS; CHEMICAL VAPOR DEPOSITION; COATINGS; DEGRADATION; EXCITONS; FILM THICKNESS; METALLIC FILMS; NANOCRYSTALLINE ALLOYS; NANOCRYSTALLINE MATERIALS; NANOSTRUCTURED MATERIALS; OPTICAL PROPERTIES; PHOTODEGRADATION; SEMICONDUCTING ZINC COMPOUNDS; SILICON; SOLIDS; STRUCTURAL PROPERTIES; SULFATE MINERALS; THICK FILMS; THIN FILMS; TUNNEL LININGS; ZINC ALLOYS; ZINC OXIDE;

(1 1 0) SURFACE; AMERICAN INSTITUTE OF PHYSICS (AIP); AVERAGE GRAIN SIZES; CRYSTALLINE PHASES; DEPOSITION TIME; DONOR ACCEPTOR (D A); FILMS THICKNESS; FREE EXCITON (FX); NANO CRYSTALLINE; NANO SCALING; NANOCRYSTALLINE ZNO; OPTICAL (PET) (OPET); PHOTOLUMINESCENCE (PL) SPECTRUM; POLY CRYSTALLINE; PROPERTY (S); RED SHIFTING; SI(1 0 0 ); SPATIAL CORRELATION MODEL; STRUCTURAL DEGRADATION; STRUCTURAL DISORDERING;

MOLECULAR BEAM EPITAXY;

EID: 45149117413     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2943656     Document Type: Article

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