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Volumn 3, Issue 1, 2011, Pages 43-52

The ways to the trace level analysis in infrared spectroscopy

Author keywords

[No Author keywords available]

Indexed keywords

ANALYTICAL TECHNIQUES; IR SPECTROSCOPY; MINIMAL SAMPLE; MINOR COMPONENT ANALYSIS; PARTS PER BILLION (PPB) LEVEL; SPECIFIC INFORMATION; TRACE LEVEL;

EID: 79951676678     PISSN: 17599660     EISSN: 17599679     Source Type: Journal    
DOI: 10.1039/c0ay00437e     Document Type: Review
Times cited : (29)

References (107)
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    • K. Kohse-Hoinghaus, J. Jeffries, (ed.), Taylor and Francis, New York
    • M. Zahniser, D. Nelson, C. Kolb, in:, K. Kohse-Hoinghaus, J. Jeffries, (ed.), Applied Combustion Diagnostics, Taylor and Francis, New York, 2002 (Chapter 26)
    • (2002) Applied Combustion Diagnostics
    • Zahniser, M.1    Nelson, D.2
  • 76
    • 10144221273 scopus 로고    scopus 로고
    • Solid-state mid-infrared sources
    • I. T. Sorokina and K. L. Vodopyanov (ed.), Springer, Berlin, Heidelberg
    • I. T. Sorokina, and, K. L. Vodopyanov, (ed.), Solid-State Mid-Infrared Sources, Topics in Applied Physics, vol. 89, Springer, Berlin, Heidelberg, 2003
    • (2003) Topics in Applied Physics , vol.89
  • 85
  • 102
    • 23244449484 scopus 로고    scopus 로고
    • Photons plus Ultrasound: Imaging and Sensing II
    • C. Fischer R. Bartlome M. W. Sigrist Photons plus Ultrasound: Imaging and Sensing II Proc. SPIE 2005 5697 56
    • (2005) Proc. SPIE , vol.5697 , pp. 56
    • Fischer, C.1    Bartlome, R.2    Sigrist, M.W.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.