Board-level fault diagnosis using an error-flow dictionary

Proceedings - International Test Conference

Volumn , Issue , 2010, Pages

  Zhang, Zhaobo ^a   Wang, Zhanglei ^b   Gu, Xinli ^b   Chakrabarty, Krishnendu ^a  

^a DUKE UNIVERSITY   (United States)

^b CISCO SYSTEMS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECTS; ERRORS; FAILURE ANALYSIS; PROGRAMMABLE LOGIC CONTROLLERS; SYSTEM-ON-CHIP;

CIRCUIT FUNCTIONALITY; DIAGNOSIS PROCEDURE; FAILURE INFORMATION; FAULT DIAGNOSIS METHOD; FUNCTIONAL FAILURE; INDUSTRIAL COMMUNICATIONS; LONGEST COMMON SUBSEQUENCES; MANUFACTURING DEFECTS;

FAULT DETECTION;

EID: 79951626969     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.2010.5699251     Document Type: Conference Paper

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