BIST: a test & diagnosis methodology for complex, high reliability electronics systems

AUTOTESTCON (Proceedings)

Volumn , Issue , 1997, Pages 398-402

  Pateras, Stephen ^a   McHugh, Patrick ^a  

^a LogicVision Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SOFTWARE; HIERARCHICAL SYSTEMS; INTEGRATED CIRCUIT TESTING; MICROPROCESSOR CHIPS;

BOUNDARY SCAN ARCHITECTURE; MAINTAINABLE SYSTEM ARCHITECTURE;

ELECTRONIC EQUIPMENT TESTING;

EID: 0031355020     PISSN: 07347510     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)