메뉴 건너뛰기




Volumn 46, Issue 1, 1997, Pages 48-59

On dictionary-based fault location in digital logic circuits

Author keywords

Compact fault dictionary; Dynamic fault diagnosis; Fault diagnosis; Fault dictionary

Indexed keywords

DIGITAL CIRCUITS; ERROR ANALYSIS; ERROR DETECTION; FAILURE ANALYSIS;

EID: 0031385395     PISSN: 00189340     EISSN: None     Source Type: Journal    
DOI: 10.1109/12.559802     Document Type: Article
Times cited : (30)

References (28)
  • 3
    • 0019213962 scopus 로고
    • Fault Dictionary Compression: Recognizing When a Fault May Be Unambiguously Represented by a Single Failure Detection
    • Nov.
    • R.E. Tulloss, "Fault Dictionary Compression: Recognizing When a Fault May Be Unambiguously Represented by a Single Failure Detection," Proc. 1980 Test Conf., pp. 368-370, Nov. 1980.
    • (1980) Proc. 1980 Test Conf. , pp. 368-370
    • Tulloss, R.E.1
  • 5
    • 0022875085 scopus 로고
    • Integrating Guided Probe and Fault Dictionary: An Enhanced Diagnostic Approach
    • V. Ratford and P. Keating, "Integrating Guided Probe and Fault Dictionary: An Enhanced Diagnostic Approach," Proc. Int'l Test Conf., pp. 304-311, 1986.
    • (1986) Proc. Int'l Test Conf. , pp. 304-311
    • Ratford, V.1    Keating, P.2
  • 6
    • 0024946216 scopus 로고
    • A Diagnosis Method Using Pseudo-Random Vectors without Intermediate Signatures
    • Nov.
    • R.C. Aitken and V.K. Agarwal, "A Diagnosis Method Using Pseudo-Random Vectors without Intermediate Signatures," Proc. 1989 Int'l Conf. Computer-Aided Design, pp. 574-577, Nov. 1989.
    • (1989) Proc. 1989 Int'l Conf. Computer-Aided Design , pp. 574-577
    • Aitken, R.C.1    Agarwal, V.K.2
  • 7
    • 0025480229 scopus 로고
    • Diagnosing CMOS Bridging Faults with Stuck-At Fault Dictionaries
    • Sept.
    • S.D. Millman, E.J. McCluskey, and J.M. Acken, "Diagnosing CMOS Bridging Faults with Stuck-At Fault Dictionaries," Proc. 1990 Int'l Test Conf., pp. 860-870, Sept. 1990.
    • (1990) Proc. 1990 Int'l Test Conf. , pp. 860-870
    • Millman, S.D.1    McCluskey, E.J.2    Acken, J.M.3
  • 9
    • 84990633161 scopus 로고
    • Fault Diagnosis Based on Effect-Cause Analysis: An Introduction
    • June
    • M. Abramovici and M.A. Breuer, "Fault Diagnosis Based on Effect-Cause Analysis: An Introduction," Proc. 17th Design Automation Conf., pp. 69-76, June 1980.
    • (1980) Proc. 17th Design Automation Conf. , pp. 69-76
    • Abramovici, M.1    Breuer, M.A.2
  • 10
    • 0019030402 scopus 로고
    • Multiple Fault Diagnosis in Combinational Circuits Based on Effect-Cause Analysis
    • June
    • M. Abramovici and M.A. Breuer, "Multiple Fault Diagnosis in Combinational Circuits Based on Effect-Cause Analysis," IEEE Trans. Computers, vol. 29, no. 6, pp. 451-460, June 1980.
    • (1980) IEEE Trans. Computers , vol.29 , Issue.6 , pp. 451-460
    • Abramovici, M.1    Breuer, M.A.2
  • 15
    • 84990699498 scopus 로고
    • A Maximal Resolution Guided-Probe Testing Algorithm
    • Aug.
    • M. Abramovici, "A Maximal Resolution Guided-Probe Testing Algorithm," Proc. 18th Design Automation Conf., pp. 189-195, Aug. 1989.
    • (1989) Proc. 18th Design Automation Conf. , pp. 189-195
    • Abramovici, M.1
  • 16
    • 0026618571 scopus 로고
    • Coupling Electron-Beam Probing with Knowledge-Based Fault Localization
    • Oct.
    • M. Marzouki, J. Laurent, and B. Courtois, "Coupling Electron-Beam Probing with Knowledge-Based Fault Localization," Proc. 1991 Int'l Test Conf., pp. 238-247, Oct. 1991.
    • (1991) Proc. 1991 Int'l Test Conf. , pp. 238-247
    • Marzouki, M.1    Laurent, J.2    Courtois, B.3
  • 17
    • 33747061518 scopus 로고
    • Test and Diagnosis Procedure for Digital Networks
    • Jan.
    • E.J. McCluskey, "Test and Diagnosis Procedure for Digital Networks," Computer, pp. 17-20, Jan. 1971.
    • (1971) Computer , pp. 17-20
    • McCluskey, E.J.1
  • 18
    • 0024138096 scopus 로고
    • GEMINI - A Logic System for Fault Diagnosis Based on Set Functions
    • June
    • J. Rajski, "GEMINI - A Logic System for Fault Diagnosis Based on Set Functions," Proc 18th Int'l Symp. Fault-Tolerant Computing, pp. 292-297, June 1988.
    • (1988) Proc 18th Int'l Symp. Fault-Tolerant Computing , pp. 292-297
    • Rajski, J.1
  • 19
    • 0024053829 scopus 로고
    • A Method of Fault Analysis for Test Generation and Fault Diagnosis
    • July
    • H. Cox and J. Rajski, "A Method of Fault Analysis for Test Generation and Fault Diagnosis," IEEE Trans. Computer-Aided Design, July 1988.
    • (1988) IEEE Trans. Computer-Aided Design
    • Cox, H.1    Rajski, J.2
  • 20
    • 0027868460 scopus 로고
    • Fault Dictionary Compression and Equivalence Class Computation for Sequential Circuits
    • Nov.
    • P.G. Ryan, W.K. Fuchs, and I. Pomeranz, "Fault Dictionary Compression and Equivalence Class Computation for Sequential Circuits," Proc. 1993 Int'l Conf. Computer-Aided Design, pp. 508-511, Nov. 1993.
    • (1993) Proc. 1993 Int'l Conf. Computer-Aided Design , pp. 508-511
    • Ryan, P.G.1    Fuchs, W.K.2    Pomeranz, I.3
  • 22
    • 0025415905 scopus 로고
    • On the Design of High-Yield Reconfigurable PLAs
    • Apr.
    • D.S. Ha and V.P. Kumar, "On the Design of High-Yield Reconfigurable PLAs," IEEE Trans. Computers, vol. 39, no. 4, pp. 470-479, Apr. 1990.
    • (1990) IEEE Trans. Computers , vol.39 , Issue.4 , pp. 470-479
    • Ha, D.S.1    Kumar, V.P.2
  • 24
    • 0026618720 scopus 로고
    • COMPACTEST: A Method to Generate Compact Test Sets for Combinational Circuits
    • Oct.
    • I. Pomeranz, L.N. Reddy, and S.M. Reddy, "COMPACTEST: A Method to Generate Compact Test Sets for Combinational Circuits," Proc. 1991 Int'l Test Conf., pp. 194-203, Oct. 1991.
    • (1991) Proc. 1991 Int'l Test Conf. , pp. 194-203
    • Pomeranz, I.1    Reddy, L.N.2    Reddy, S.M.3
  • 25
    • 0019613185 scopus 로고
    • Sampling Techniques for Determining Fault Coverage in LSI Circuits
    • V.D. Agrawal, "Sampling Techniques for Determining Fault Coverage in LSI Circuits," J. Digital Systems, vol. V, pp. 189-202, 1981.
    • (1981) J. Digital Systems , vol.5 , pp. 189-202
    • Agrawal, V.D.1
  • 28
    • 33747055265 scopus 로고    scopus 로고
    • On Dictionary-Based Fault Diagnosis in Digital Logic Circuits
    • Electrical and Computer Eng. Dept., Univ. of Iowa
    • I. Pomeranz and S.M. Reddy, "On Dictionary-Based Fault Diagnosis in Digital Logic Circuits," Technical Report 8-15-1992, Electrical and Computer Eng. Dept., Univ. of Iowa.
    • Technical Report 8-15-1992
    • Pomeranz, I.1    Reddy, S.M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.