Dielectrophoretic alignment of metal and metal oxide nanowires and nanotubes: A universal set of parameters for bridging prepatterned microelectrodes

Journal of Colloid and Interface Science

Volumn 355, Issue 2, 2011, Pages 486-493

  Maijenburg, A W ^a   Maas, M G ^a   Rodijk, E J B ^a   Ahmed, W ^a   Kooij, E S ^a   Carlen, E T ^a   Blank, D H A ^a   ten Elshof, J E ^a  

^a UNIVERSITY OF TWENTE   (Netherlands)

Author keywords

Alignment; Dielectrophoresis; Nanotubes; Nanowires; Templated electrodeposition

Indexed keywords

ALIGNMENT TECHNIQUE; CATHODIC ELECTRODEPOSITION; DIELECTROPHORESIS; DIELECTROPHORETIC; LOW DIELECTRIC CONSTANTS; METAL OXIDE NANOWIRES; METAL OXIDES; NANOWIRE MATERIALS; PEAK POTENTIALS; SHORT CIRCUITING; SILICON OXIDE LAYERS; SILICON SUBSTRATES; TEMPLATED; TEMPLATED ELECTRODEPOSITION; ZNO NANOROD; ZNO NANOWIRES;

ALIGNMENT; ELECTRODEPOSITION; ELECTROPHORESIS; METALLIC COMPOUNDS; METALS; MICROELECTRODES; MOLECULAR BEAM EPITAXY; MOLECULAR BEAMS; NANORODS; NANOTUBES; SILICON COMPOUNDS; SILICON OXIDES; ZINC OXIDE;

NANOWIRES;

METAL; METAL OXIDE; NANOROD; NANOTUBE; NANOWIRE; SILICON; ZINC OXIDE;

ARTICLE; CONTROLLED STUDY; DIELECTRIC CONSTANT; ELECTRODE; ELECTROPHORESIS; MICROELECTRODE; PRIORITY JOURNAL; SCANNING ELECTRON MICROSCOPY;

ELECTROPLATING; MATERIALS TESTING; METALS; MICROELECTRODES; NANOTECHNOLOGY; NANOTUBES; NANOWIRES; SILICON; SURFACE PROPERTIES;

EID: 79551487793     PISSN: 00219797     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcis.2010.12.011     Document Type: Article

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