Substrate effects and chemical state plots for the XPS analysis of supported TiO2 catalysts

Surface and Interface Analysis

Volumn 25, Issue 4, 1997, Pages 292-294

  Jimenez V M ^a   Lassaletta, G ^a   Fernandez A ^a   Espinos J P ^a   Gonzalez Elipe A R ^a  

^a INSTITUTO DE CIENCIA DE MATERIALES DE SEVILLA   (Spain)

Author keywords

Auger parameter; Catalyst; Chemical state plot; TiO2; XPS

Indexed keywords

BINDING ENERGY; CATALYST SUPPORTS; CATALYSTS; COMPOSITION EFFECTS; DEPOSITION; MAGNESIA; SILICA; SILVER; SUBSTRATES; TIN COMPOUNDS; X RAY PHOTOELECTRON SPECTROSCOPY;

CHEMICAL SHIFTS; TIN OXIDE;

TITANIUM DIOXIDE;

EID: 0031121519     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1096-9918(199704)25:4<292::AID-SIA214>3.0.CO;2-D     Document Type: Article

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