Knitted fabric defect classification for uncertain labels based on Dempster-Shafer theory of evidence

Expert Systems with Applications

Volumn 38, Issue 5, 2011, Pages 5259-5267

  Tabassian, Mahdi ^a,b   Ghaderi, Reza ^a   Ebrahimpour, Reza ^b,c  

^a BABOL NOSHIRVANI UNIVERSITY OF TECHNOLOGY   (Iran)

^b INSTITUTE FOR RESEARCH IN FUNDAMENTAL SCIENCES IPM   (Iran)

^c SHAHID RAJAEE TEACHER TRAINING UNIVERSITY   (Iran)

Author keywords

Circular knitted fabric defect; K nearest neighbors; MLP neural network; Theory of evidence; Uncertainty in labels; Wavelet transform

Indexed keywords

K-NEAREST NEIGHBORS; KNITTED FABRIC; MLP NEURAL NETWORKS; THEORY OF EVIDENCE; UNCERTAINTY IN LABELS;

DEFECTS; FORMAL LOGIC; KNIT FABRICS; WAVELET TRANSFORMS;

NEURAL NETWORKS;

EID: 79151476013     PISSN: 09574174     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.eswa.2010.10.032     Document Type: Article

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