Linear flaw detection in woven textiles using model-based clustering

Pattern Recognition Letters

Volumn 18, Issue 14, 1997, Pages 1539-1548

  Campbell, J G ^a   Fraley, C ^b,c   Murtagh, F ^a   Raftery, A E ^b  

^a UNIVERSITY OF ULSTER   (United Kingdom)

^b UNIVERSITY OF WASHINGTON   (United States)

^c Parametric Technology Corporation   (United States)

Author keywords

Bayesian cluster analysis; Hough transform; Industrial inspection; Machine vision; Model based clustering; Pattern recognition

Indexed keywords

COMPUTER VISION; IMAGE PROCESSING; INSPECTION; PATTERN RECOGNITION; TEXTILES;

BAYES FACTOR; HOUGH TRANSFORM; LINEAR FLAW DETECTION; MODEL BASED CLUSTERING;

EDGE DETECTION;

FABRICS, WOVEN; IMAGE ANALYSIS; MATHEMATICAL MODELS; TESTING, LINEAR-FAULT;

EID: 0031395002     PISSN: 01678655     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0167-8655(97)00148-7     Document Type: Article

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