Vision system for onloom fabric inspection

IEEE Transactions on Industry Applications

Volumn 35, Issue 6, 1999, Pages 12521259-

  SariSarraf, Hamed ^a   Goddard Jr , James S ^b  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b Texas Tech University   (United States)

Author keywords

Computer vision; Defect detection; Fabric inspection; Wavelet transform

Indexed keywords

EID: 33747476443     PISSN: 00939994     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (21)

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