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Thin Solid Films

Volumn 519, Issue 7, 2011, Pages 2135-2140

Structural and photocarrier radiometric characterization of Cu x(CdTe)yOz thin films growth by reactive sputtering

(5) Velazquez Hernandez, R a Rojas Rodriguez, I b Carmona Rodriguez J c Jimenez Sandoval S c Rodriguez Garcia, M E d

a UNIVERSIDAD AUTÓNOMA DE QUERÉTARO (Mexico)

b División Industrial (Mexico)

c DEPARTAMENTO DE FÍSICA (Mexico)

d CENTRO DE FÍSICA APLICADA Y TECNOLOGÍA AVANZADA (Mexico)

Author keywords

Carrier distribution; Photocarrier radiometric characterization; Quaternary semiconductors; Sputtering

Indexed keywords

CARRIER DISTRIBUTIONS; CDTE; CU TARGET; DOPANT CONCENTRATIONS; ELECTRONIC DISTRIBUTION; MICRO RAMAN SPECTROSCOPY; NON DESTRUCTIVE; NON-CONTACT; PHOTOCARRIER; QUATERNARY SEMICONDUCTORS; RADIO-FREQUENCY CO-SPUTTERING; RADIOMETRIC CHARACTERIZATION; RADIOMETRIC IMAGES; STRUCTURAL CHARACTERIZATION; THIN FILMS GROWTH;

CADMIUM ALLOYS; CADMIUM COMPOUNDS; PHOTOELECTRICITY; RAMAN SPECTROSCOPY; SEMICONDUCTOR GROWTH; SPUTTER DEPOSITION; THIN FILMS; X RAY DIFFRACTION;

RADIOMETRY;

EID: 78751647408 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/j.tsf.2010.11.011 Document Type: Article

Times cited : (4)

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