-
1
-
-
0004071496
-
-
(Wiley, New York), Cha;, (Academic, New York, 1983), Cha
-
D. K. Schroder, Semiconductor Material and Device Characterization (Wiley, New York, 1998), Chap.; A. L. Fahrenbruch and R. H. Bube, Fundamentals of Solar Energy Conversion (Academic, New York, 1983), Chap..
-
(1998)
Semiconductor Material and Device Characterization, Fundamentals of Solar Energy Conversion
-
-
Schroder, D.K.1
Fahrenbruch, A.L.2
Bube, R.H.3
-
2
-
-
33845774405
-
Application of photoluminescence characterization to the development and manufacturing of high-efficiency silicon solar cells
-
DOI 10.1063/1.2398724
-
M. D. Abbott, J. E. Cotter, F. W. Chen, T. Trupke, R. A. Bardos, and K. C. Fisher, J. Appl. Phys. JAPIAU 0021-8979 100, 114514 (2006). 10.1063/1.2398724 (Pubitemid 46012269)
-
(2006)
Journal of Applied Physics
, vol.100
, Issue.11
, pp. 114514
-
-
Abbott, M.D.1
Cotter, J.E.2
Chen, F.W.3
Trupke, T.4
Bardos, R.A.5
Fisher, K.C.6
-
3
-
-
0037391034
-
-
JAPIAU 0021-8979. 10.1063/1.1555688
-
J. Isenberg, S. Riepe, S. Glunz, and W. Warta, J. Appl. Phys. JAPIAU 0021-8979 93, 4268 (2003). 10.1063/1.1555688
-
(2003)
J. Appl. Phys.
, vol.93
, pp. 4268
-
-
Isenberg, J.1
Riepe, S.2
Glunz, S.3
Warta, W.4
-
4
-
-
33745226701
-
Determination of spatially resolved trapping parameters in silicon with injection dependent carrier density imaging
-
DOI 10.1063/1.2202729
-
M. C. Schubert, S. Riepe, S. Bermejo, and W. Warta, J. Appl. Phys. JAPIAU 0021-8979 99, 114908 (2006). 10.1063/1.2202729 (Pubitemid 43926556)
-
(2006)
Journal of Applied Physics
, vol.99
, Issue.11
, pp. 114908
-
-
Schubert, M.C.1
Riepe, S.2
Bermejo, S.3
Warta, W.4
-
5
-
-
22144480285
-
Photographic surveying of minority carrier diffusion length in polycrystalline silicon solar cells by electroluminescence
-
DOI 10.1063/1.1978979, 262108
-
T. Fuyuki, H. Kondo, T. Yamasaki, Y. Takahashi, and Y. Uraoka, Appl. Phys. Lett. APPLAB 0003-6951 86, 262108 (2005). 10.1063/1.1978979 (Pubitemid 40983206)
-
(2005)
Applied Physics Letters
, vol.86
, Issue.26
, pp. 1-3
-
-
Fuyuki, T.1
Kondo, H.2
Yamazaki, T.3
Takahashi, Y.4
Uraoka, Y.5
-
6
-
-
33746649178
-
Photoluminescence imaging of silicon wafers
-
DOI 10.1063/1.2234747
-
T. Trupke, R. A. Bardos, M. C. Shubert, and W. Warta, Appl. Phys. Lett. APPLAB 0003-6951 89, 044107 (2006). 10.1063/1.2234747 (Pubitemid 44147627)
-
(2006)
Applied Physics Letters
, vol.89
, Issue.4
, pp. 044107
-
-
Trupke, T.1
Bardos, R.A.2
Schubert, M.C.3
Warta, W.4
-
7
-
-
34547326879
-
Diffusion lengths of silicon solar cells from luminescence images
-
DOI 10.1063/1.2749201
-
P. Würfel, T. Trupke, T. Puzzer, E. Schäffer, W. Warta, and S. W. Glunz, J. Appl. Phys. JAPIAU 0021-8979 101, 123110 (2007). 10.1063/1.2749201 (Pubitemid 47141271)
-
(2007)
Journal of Applied Physics
, vol.101
, Issue.12
, pp. 123110
-
-
Wurfel, P.1
Trupke, T.2
Puzzer, T.3
Schaffer, E.4
Warta, W.5
Glunz, S.W.6
-
9
-
-
77951597050
-
-
Milan, Italy, 3-7 Sept.
-
T. Trupke, R. A. Bardos, M. D. Abbott, P. Wurfel, Proceedings of the 22nd European Photovoltaic Solar Energy Conference., Milan, Italy, 3-7 Sept. 2007, pp. 22-31
-
(2007)
Proceedings of the 22nd European Photovoltaic Solar Energy Conference
, pp. 22-31
-
-
Trupke, T.1
Bardos, R.A.2
Abbott, M.D.3
Wurfel, P.4
-
10
-
-
10844260636
-
Defect passivation in multicrystalline silicon for solar cells
-
DOI 10.1063/1.1815380
-
I. Tarasov, S. Ostapenko, K. Nakayashiki, and A. Rohatgi, Appl. Phys. Lett. APPLAB 0003-6951 85, 4346 (2004). 10.1063/1.1815380 (Pubitemid 40001509)
-
(2004)
Applied Physics Letters
, vol.85
, Issue.19
, pp. 4346-4348
-
-
Tarasov, I.1
Ostapenko, S.2
Nakayashiki, K.3
Rohatgi, A.4
-
11
-
-
77953623573
-
-
Milan, Italy, 3-7 September
-
M. B. Edwards, J. Bocking, M. D. Abbott, and J. E. Cotter, Proceedings of the 22nd European Photovoltaic Solar Energy Conference, Milan, Italy, 3-7 September 2007, pp. 1006-1010.
-
(2007)
Proceedings of the 22nd European Photovoltaic Solar Energy Conference
, pp. 1006-1010
-
-
Edwards, M.B.1
Bocking, J.2
Abbott, M.D.3
Cotter, J.E.4
-
13
-
-
77950633085
-
-
JPCSDZ 1742-6588. 10.1088/1742-6596/214/1/012111
-
A. Melnikov, A. Mandelis, J. Tolev, and E. Lioudakis, J. Phys.: Conf. Ser. JPCSDZ 1742-6588 214, 012111 (2010). 10.1088/1742-6596/214/1/012111
-
(2010)
J. Phys.: Conf. Ser.
, vol.214
, pp. 012111
-
-
Melnikov, A.1
Mandelis, A.2
Tolev, J.3
Lioudakis, E.4
-
14
-
-
0023042990
-
Nondestructive depth profiling of carrier lifetimes in full silicon wafers
-
DOI 10.1063/1.96764
-
D. Guidotti, J. S. Batchelder, J. A. Van Vechten, and A. Finkel, Appl. Phys. Lett. APPLAB 0003-6951 48, 68 (1986). 10.1063/1.96764 (Pubitemid 17615607)
-
(1986)
Applied Physics Letters
, vol.48
, Issue.1
, pp. 68-70
-
-
Guidotti, D.1
Batchelder, J.S.2
Van Vechten, J.A.3
Finkel, A.4
-
15
-
-
2442528465
-
-
PRBMDO 0163-1829 10.1103/PhysRevB.38.1569
-
D. Guidotti, J. S. Batchelder, A. Finkel, and J. A. Van Vechten, Phys. Rev. B PRBMDO 0163-1829 38, 1569 (1988) 10.1103/PhysRevB.38.1569
-
(1988)
Phys. Rev. B
, vol.38
, pp. 1569
-
-
Guidotti, D.1
Batchelder, J.S.2
Finkel, A.3
Van Vechten, J.A.4
-
16
-
-
5544310869
-
-
JAPIAU 0021-8979 10.1063/1.344218
-
D. Guidotti, J. S. Batchelder, A. Finkel, P. D. Gerber, and J. A. Van Vetchen, J. Appl. Phys. JAPIAU 0021-8979 66, 2542 (1989). 10.1063/1.344218
-
(1989)
J. Appl. Phys.
, vol.66
, pp. 2542
-
-
Guidotti, D.1
Batchelder, J.S.2
Finkel, A.3
Gerber, P.D.4
Van Vetchen, J.A.5
-
17
-
-
0033328754
-
Overcoming doping bottlenecks in semiconductors and wide-gap materials
-
DOI 10.1016/S0921-4526(99)00605-5
-
S. B. Zhang, S. -H. Wei, and A. Zunger, Physica B PHYBE3 0921-4526 273-274, 976 (1999). 10.1016/S0921-4526(99)00605-5 (Pubitemid 30522534)
-
(1999)
Physica B: Condensed Matter
, vol.273
, pp. 976-980
-
-
Zhang, S.B.1
Wei, S.-H.2
Zunger, A.3
-
18
-
-
34848840696
-
Nonlinear dependence of photocarrier radiometry signals from p- Si wafers on optical excitation intensity
-
DOI 10.1149/1.2780862
-
J. Tolev, A. Mandelis, and M. Pawlak, J. Electrochem. Soc. JESOAN 0013-4651 154, H983 (2007). 10.1149/1.2780862 (Pubitemid 47501813)
-
(2007)
Journal of the Electrochemical Society
, vol.154
, Issue.11
-
-
Tolev, J.1
Mandelis, A.2
Pawlak, M.3
-
19
-
-
0001249030
-
-
JAPIAU 0021-8979. 10.1063/1.351366
-
G. Busse, D. Wu, and W. Karpen, J. Appl. Phys. JAPIAU 0021-8979 71, 3962 (1992). 10.1063/1.351366
-
(1992)
J. Appl. Phys.
, vol.71
, pp. 3962
-
-
Busse, G.1
Wu, D.2
Karpen, W.3
-
20
-
-
4944262436
-
-
APPLAB 0003-6951. 10.1063/1.1785289
-
J. Batista, A. Mandelis, D. Shaughnessy, and B. Li, Appl. Phys. Lett. APPLAB 0003-6951 85, 1713 (2004). 10.1063/1.1785289
-
(2004)
Appl. Phys. Lett.
, vol.85
, pp. 1713
-
-
Batista, J.1
Mandelis, A.2
Shaughnessy, D.3
Li, B.4
-
22
-
-
33644806475
-
Electronic defect and contamination monitoring in Si wafers using spectrally integrated photocarrier radiometry
-
DOI 10.1149/1.2168052
-
D. Shaughnessy and A. Mandelis, J. Electrochem. Soc. JESOAN 0013-4651 153, G283 (2006). 10.1149/1.2168052 (Pubitemid 43352258)
-
(2006)
Journal of the Electrochemical Society
, vol.153
, Issue.4
-
-
Shaughnessy, D.1
Mandelis, A.2
-
23
-
-
77953631578
-
-
QIRT J. (submitted)
-
A. Melnikov, A. Mandelis, J. Tolev, J. Xia, and E. Lioudakis, " Non-destructive infrared optoelectronic lock-in carrierography of mc-Si solar cells.," QIRT J. (submitted).
-
Non-destructive Infrared Optoelectronic Lock-in Carrierography of Mc-Si Solar Cells
-
-
Melnikov, A.1
Mandelis, A.2
Tolev, J.3
Xia, J.4
Lioudakis, E.5
-
24
-
-
33751034554
-
-
JAPIAU 0021-8979. 10.1063/1.343662
-
A. Mandelis, J. Appl. Phys. JAPIAU 0021-8979 66, 5572 (1989). 10.1063/1.343662
-
(1989)
J. Appl. Phys.
, vol.66
, pp. 5572
-
-
Mandelis, A.1
-
26
-
-
0020706839
-
-
JAPLD8 0021-4922. 10.1143/JJAP.22.L103
-
C. Munakata, N. Honma, and H. Itoh, Jpn. J. Appl. Phys., Part 2 JAPLD8 0021-4922 22, L103 (1983). 10.1143/JJAP.22.L103
-
(1983)
Jpn. J. Appl. Phys., Part 2
, vol.22
, pp. 103
-
-
Munakata, C.1
Honma, N.2
Itoh, H.3
-
27
-
-
0022721372
-
-
JAPNDE 0021-4922. 10.1143/JJAP.25.743
-
N. Honma, C. Munakata, H. Itoh, and T. Warabisako, Jpn. J. Appl. Phys., Part 1 JAPNDE 0021-4922 25, 743 (1986). 10.1143/JJAP.25.743
-
(1986)
Jpn. J. Appl. Phys., Part 1
, vol.25
, pp. 743
-
-
Honma, N.1
Munakata, C.2
Itoh, H.3
Warabisako, T.4
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