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Volumn 17, Issue 4, 1999, Pages 1958-1962
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Structure and electronic properties of the novel semiconductor alloy Cd1-xCuxTe
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC ORDERS;
BAND GAPS;
BAND-GAP VALUES;
BULK SAMPLES;
CDTE;
COPPER CONTENT;
CORNING GLASS;
GROWTH OF FILMS;
HIGH-CRYSTALLINE QUALITY;
LATTICE PARAMETERS;
LONGITUDINAL OPTICS;
MICRO RAMAN SPECTROSCOPY;
OPTICAL TRANSMISSIONS;
PHOTOREFLECTANCE SPECTROSCOPY;
RAMAN BANDS;
RAMAN EXPERIMENTS;
RF-SPUTTERING;
SECOND AND THIRD HARMONICS;
SEMI-CONDUCTOR ALLOYS;
ALLOYS;
ATOMIC SPECTROSCOPY;
CADMIUM COMPOUNDS;
COPPER;
DIFFRACTION;
ELECTRONIC PROPERTIES;
ENERGY GAP;
FERROELECTRIC MATERIALS;
LIGHT TRANSMISSION;
RAMAN SPECTROSCOPY;
SEMICONDUCTOR GROWTH;
THIN FILMS;
X RAY DIFFRACTION;
CADMIUM ALLOYS;
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EID: 22644449265
PISSN: 07342101
EISSN: None
Source Type: Journal
DOI: 10.1116/1.581710 Document Type: Conference Paper |
Times cited : (10)
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References (14)
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