Structural properties of thin films of the novel Cux(CdTe)yOz semiconductor system

Journal of Crystal Growth

Volumn 294, Issue 2, 2006, Pages 243-249

  Jimenez Sandoval S ^a   Santos Cruz, J ^a   Garnett Ruiz, G E ^a   Castanedo Perez R ^a   Torres Delgado, G ^a   Jimenez Sandoval O ^a  

^a INSTITUTO POLITÉCNICO NACIONAL   (Mexico)

Author keywords

A1. Crystal structure; A1. X ray diffraction; A3. Sputtering; B2. Semiconducting cadmium compounds

Indexed keywords

CONCENTRATION (PROCESS); COPPER; CRYSTAL STRUCTURE; FILM GROWTH; PARTIAL PRESSURE; REACTIVE SPUTTERING; SEMICONDUCTING CADMIUM TELLURIDE; STRUCTURAL PROPERTIES; X RAY DIFFRACTION;

CRYSTALLINE STATES; GROWTH CHAMBERS;

THIN FILMS;

EID: 33947117384     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2006.06.015     Document Type: Article

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