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Volumn 67, Issue 20, 2003, Pages

Infrared photocarrier radiometry of semiconductors: Physical principles, quantitative depth profilometry, and scanning imaging of deep subsurface electronic defects

Author keywords

[No Author keywords available]

Indexed keywords

GALLIUM;

EID: 3142704014     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.67.205208     Document Type: Article
Times cited : (166)

References (40)
  • 14
    • 0003529141 scopus 로고    scopus 로고
    • A. Mandelis and P. Hess, Progress in Photoacoustic and Photothermal Phenomena Vol. IV (SPIE, Bellingham, WA, Chap. 4
    • C. Christofides, M. Nestoros, and A. Othonos, in Semiconductors and Electronic Materials, edited by A. Mandelis and P. Hess, Progress in Photoacoustic and Photothermal Phenomena Vol. IV (SPIE, Bellingham, WA, 2000), Chap. 4.
    • (2000) Semiconductors and Electronic Materials
    • Christofides, C.1    Nestoros, M.2    Othonos, A.3
  • 34
    • 0004278609 scopus 로고
    • 2nd ed. Cambridge University Press, Cambridge
    • R.A. Smith, Semiconductors, 2nd ed. (Cambridge University Press, Cambridge, 1978), pp. 118–119.
    • (1978) Semiconductors , pp. 118-119
    • Smith, R.A.1
  • 37
    • 85039019912 scopus 로고    scopus 로고
    • Judson Technologies Detector Offerings
    • Judson Technologies Detector Offerings; www.judtech.com


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.