Si nanorod length dependent surface Raman scattering linewidth broadening and peak shift

Optics Express

Volumn 19, Issue 2, 2011, Pages 597-605

  Lin, Gong Ru ^a   Lin, Yung Hsiang ^a   Pai, Yi Hao ^a   Meng, Fan Shuen ^a  

^a NATIONAL TAIWAN UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; DANGLING BONDS; FOURIER TRANSFORM INFRARED SPECTROSCOPY; FOURIER TRANSFORMS; LATTICE VIBRATIONS; LINEWIDTH; NANORODS; RAMAN SCATTERING; SCATTERING;

CRYSTAL QUALITIES; INTERACTION AREA; LINEWIDTH BROADENING; NANOROD SURFACES; PEAK INTENSITY; PEAK SHIFT; PHONON MODE; RAMAN PEAK; RAMAN PEAK SHIFTS; RAMAN SCATTERING INTENSITY; SCATTERING SIGNALS; SI DANGLING BONDS; SI-O-SI BOND; STRAINED-SI; STRETCHING MODES; SURFACE AREA; SURFACE DANGLING BONDS; VERTICALLY ALIGNED;

SILICON;

NANOTUBE; SILICON;

ARTICLE; CHEMISTRY; LIGHT; METHODOLOGY; RADIATION SCATTERING; SURFACE PLASMON RESONANCE; ULTRASTRUCTURE;

LIGHT; NANOTUBES; SCATTERING, RADIATION; SILICON; SURFACE PLASMON RESONANCE;

EID: 78751536331     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.19.000597     Document Type: Article

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