In situ monitoring of Raman scattering and photoluminescence from silicon surfaces in HF aqueous solutions

Applied Physics Letters

Volumn 72, Issue 8, 1998, Pages 933-935

  Ren, B ^a   Liu, F M ^a   Xie, J ^a   Mao, B W ^a   Zu, Y B ^a   Tian, Z Q ^a  

^a XIAMEN UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL BONDS; ELECTROCHEMISTRY; ETCHING; HYDROFLUORIC ACID; MOLECULAR VIBRATIONS; PHOTOLUMINESCENCE; QUANTUM OPTICS; RAMAN SCATTERING; RAMAN SPECTROSCOPY; SPECTROSCOPY; SURFACE ROUGHNESS; SURFACE TREATMENT;

CONFOCAL MICROPROBE RAMAN SYSTEM; ELECTROCHEMICAL ROUGHENING PRETREATMENT; LASER ASSISTED ROUGHENING PROCEDURE; PHOTOLUMINESCENCE SPECTRA; SURFACE BONDING;

SEMICONDUCTING SILICON;

EID: 0032000999     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.120877     Document Type: Article

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