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Physical Review B - Condensed Matter and Materials Physics

Volumn 63, Issue 3, 2001, Pages 353091-3530911

Strain effect in silicon-on-insulator materials: Investigation with optical phonons

(3) Camassel, J a Falkovsky, L A a Planes, N a

a UNIVERSITÉ MONTPELLIER 2 (France)

Author keywords

[No Author keywords available]

Indexed keywords

SILICON; SILICON DIOXIDE;

ARTICLE; COMPRESSION; EXPERIMENT; INFRARED SPECTROMETRY; MODEL; OPTICS; RAMAN SPECTROMETRY; REFLECTOMETRY; SEMICONDUCTOR; STRESS STRAIN RELATIONSHIP; SURFACE PROPERTY; THEORY;

EID: 0035130948 PISSN: 01631829 EISSN: None Source Type: Journal
DOI: None Document Type: Article

Times cited : (46)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.