Manipulative depolarization and reflectance spectra of morphologically controlled nano-pillars and nano-rods

Optics Express

Volumn 17, Issue 23, 2009, Pages 20824-20832

  Lin, Gong Ru ^a   Meng, Fan Shuen ^a   Pai, Yi Hao ^a   Chang, Yia Chung ^b   Hsu, Shih Hsin ^b  

^a NATIONAL TAIWAN UNIVERSITY   (Taiwan)

^b RESEARCH CENTER FOR APPLIED SCIENCES   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

ASPECT RATIO; DEPOLARIZATION; NANORODS; PERMITTIVITY; REFLECTION;

ANTI REFLECTION; DEPOLARIZATION RATIO; DESTRUCTIVE INTERFERENCE; EFFECTIVE DIELECTRIC PERMITTIVITIES; REFLECTANCE SPECTRUM; SURFACE REFLECTANCE; SURFACE REFLECTIONS; WAVELENGTH REGIONS;

SILICON;

NANOMATERIAL; NANOPARTICLE; SILICON;

ALGORITHM; ARTICLE; CHEMISTRY; COMPUTER SIMULATION; ELECTRON; EQUIPMENT DESIGN; METHODOLOGY; NANOTECHNOLOGY; NEAR INFRARED SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; STATISTICAL MODEL; TRANSMISSION ELECTRON MICROSCOPY; ULTRAVIOLET RADIATION;

ALGORITHMS; COMPUTER SIMULATION; ELECTRONS; EQUIPMENT DESIGN; MICROSCOPY, ELECTRON, SCANNING; MICROSCOPY, ELECTRON, TRANSMISSION; MODELS, STATISTICAL; NANOPARTICLES; NANOSTRUCTURES; NANOTECHNOLOGY; SILICON; SPECTROSCOPY, NEAR-INFRARED; ULTRAVIOLET RAYS;

EID: 70749144793     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.17.020824     Document Type: Article

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