Site-specific stereograph of SiC(0001) surface by inverse matrix method

Journal of the Physical Society of Japan

Volumn 80, Issue 1, 2011, Pages

  Matsui, Fumihiko ^a   Nishikayama, Noriyuki ^a   Maejima, Naoyuki ^a   Matsui, Hirosuke ^a   Goto, Kentaro ^a   Hashimoto, Mie ^a   Hatayama, Tomoaki ^a   Matsushita, Tomohiro ^a,b   Kato, Yukako ^a,b   Tanaka, Satoru ^a,c   Daimon, Hiroshi ^a  

^a NARA INSTITUTE OF SCIENCE AND TECHNOLOGY   (Japan)

^b JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE   (Japan)

^c KYUSHU UNIVERSITY   (Japan)

Author keywords

Crystal structure; Forward focusing peak; Photoelectron diffraction; SiC; Stereo atomscope

Indexed keywords

EID: 78651275694     PISSN: 00319015     EISSN: 13474073     Source Type: Journal    
DOI: 10.1143/JPSJ.80.013601     Document Type: Article

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