Atomic-layer-resolved analysis of surface magnetism by diffraction spectroscopy

Journal of Electron Spectroscopy and Related Phenomena

Volumn 181, Issue 2-3, 2010, Pages 150-153

  Matsui, Fumihiko ^a   Matsushita, Tomohiro ^b   Daimon, Hiroshi ^a  

^a NARA INSTITUTE OF SCIENCE AND TECHNOLOGY   (Japan)

^b JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE   (Japan)

Author keywords

Auger electron diffraction; Magnetic circular dichroism; Subsurface; Surface magnetism; X ray absorption spectroscopy

Indexed keywords

ANALYSIS TOOLS; ATOMIC LAYER; AUGER ELECTRON; DIFFRACTION SPECTROSCOPY; ELECTRON MEAN-FREE PATH; MAGNETIC CIRCULAR DICHROISMS; SUBSURFACE; SURFACE MAGNETISM; X-RAY ABSORPTION NEAR-EDGE STRUCTURE; X-RAY MAGNETIC CIRCULAR DICHROISM; XANES;

ABSORPTION; ATOMIC SPECTROSCOPY; ATOMS; AUGERS; CIRCULAR DICHROISM SPECTROSCOPY; DICHROISM; ELECTRON DIFFRACTION; ELECTRONS; MAGNETIC DEVICES; MAGNETIC STRUCTURE; MAGNETISM; SPECTRUM ANALYSIS; X RAY ABSORPTION; X RAY ABSORPTION SPECTROSCOPY; X RAY DIFFRACTION ANALYSIS; X RAYS;

AUGER ELECTRON SPECTROSCOPY;

EID: 77955853902     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elspec.2010.02.015     Document Type: Conference Paper

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