Measuring the contrast in annular dark field STEM images as a function of camera length

Journal of Physics: Conference Series

Volumn 241, Issue , 2010, Pages

  Walther, T ^a   Qiu, Y ^a   Cullis, A G ^a  

^a UNIVERSITY OF SHEFFIELD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMS; ELECTRON MICROSCOPY; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; HOLE CONCENTRATION; INDIUM; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

ANNULAR DETECTORS; CHEMICAL COMPOSITIONS; COLLECTION ANGLE; DIFFRACTION PLANES; RUTHERFORD SCATTERING; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SCATTERING ANGLES; SCATTERING MECHANISMS;

CAMERAS;

EID: 78651070775     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/241/1/012068     Document Type: Conference Paper

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