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JOM
Volumn 62, Issue 12, 2010, Pages 64-69
The use of advanced characterization to study transitions across solid state interfaces
Author keywords

[No Author keywords available]
Indexed keywords

ATOM PROBE TOMOGRAPHY; ATOMIC SCALE; CHARACTERIZATION TECHNIQUES; HIGH RESOLUTION SCANNING; MULTI-COMPONENT SYSTEMS; NICKEL BASE SUPERALLOY; PHYSICAL AND MECHANICAL PROPERTIES; SOLID-SOLID INTERFACES;
EID: 78650871076     PISSN: 10474838     EISSN: 15431851     Source Type: Journal    
DOI: 10.1007/s11837-010-0183-7     Document Type: Review
Times cited : (8)
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