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Volumn 36, Issue 5-6 SPEC. ISS., 2004, Pages 594-597

Dependence of interfacial excess on the threshold value of the isoconcentration surface

Author keywords

Heterophase interface; Interfacial segregation; Ni based superalloy; Three dimensional atom probe microscopy

Indexed keywords

ELECTROLYTIC POLISHING; EVAPORATION; HEAT TREATMENT; INTERFACES (MATERIALS); MICROSCOPIC EXAMINATION; SINGLE CRYSTALS;

INTERFACIAL SEGREGATION; ISOCONCENTRATION SURFACE; NI-BASED SUPERALLOYS;

NICKEL ALLOYS;

EID: 3042658382 PISSN: 01422421 EISSN: None Source Type: Journal
DOI: 10.1002/sia.1708 Document Type: Conference Paper

Times cited : (58)

References (12)

1
- 36549104814
- Cerezo A, Godfrey TJ, Smith GDW. Rev. Sci. Instrum. 1988; 59: 862.
- (1988) Rev. Sci. Instrum. , vol.59 , pp. 862
- Cerezo, A.¹ Godfrey, T.J.² Smith, G.D.W.³

2
- 36048945570
- Blavette D, Deconihout B, Bostel A, Sarrau JM, Bouet M, Menand A. Rev. Sci. Instrum. 1993; 64: 2911.
- (1993) Rev. Sci. Instrum. , vol.64 , pp. 2911
- Blavette, D.¹ Deconihout, B.² Bostel, A.³ Sarrau, J.M.⁴ Bouet, M.⁵ Menand, A.⁶

3
- 0347745071
- Cerezo A, Godfrey TJ, Sijbrandij SJ, Smith GDW, Warren PJ. Rev. Sci. Instrum. 1998; 69: 49.
- (1998) Rev. Sci. Instrum. , vol.69 , pp. 49
- Cerezo, A.¹ Godfrey, T.J.² Sijbrandij, S.J.³ Smith, G.D.W.⁴ Warren, P.J.⁵

4
- 0000675833
- Hellman OC, Vandenbroucke JA, Rusing J, Isheim D, Seidman DN. Microsc. Microanal. 2000; 6: 437.
- (2000) Microsc. Microanal. , vol.6 , pp. 437
- Hellman, O.C.¹ Vandenbroucke, J.A.² Rusing, J.³ Isheim, D.⁴ Seidman, D.N.⁵

5
- 3042577821
- US patent 5,270,123
- Walston WS, Ross EW, O'Hara KS, Pollock TM. US patent 5,270,123, 1993.
- (1993)
- Walston, W.S.¹ Ross, E.W.² O'Hara, K.S.³ Pollock, T.M.⁴

6
- 0003800798
- Plenum Press: New York
- Miller MK. Atom Probe Tomography: Analysis at the Atomic Level. Plenum Press: New York, 2000; 115.
- (2000) Atom Probe Tomography: Analysis at the Atomic Level , pp. 115
- Miller, M.K.¹

7
- 0037089969
- Hellman O, Vandenbroucke J, du Blatz Rivage J, Seidman DN. Mater. Sci. Eng. A 2002; 327: 29.
- (2002) Mater. Sci. Eng. A , vol.327 , pp. 29
- Hellman, O.¹ Vandenbroucke, J.² Du Blatz Rivage, J.³ Seidman, D.N.⁴

8
- 0029410510
- Wanderka N, Glatzel U. Mater. Sci. Eng. A 1995; 203: 69.
- (1995) Mater. Sci. Eng. A , vol.203 , pp. 69
- Wanderka, N.¹ Glatzel, U.²

9
- 3042581383
- Weertman JR, Fine M, Faber K, et al. (eds). TMS: Warrendale, PA
- Sudbrack CK, Yoon KE, Mao Z, Noebe RD, Isheim D, Seidman DN. In Electron Microscopy: its Role in Materials Research - The Mike Meshii Symposium, Weertman JR, Fine M, Faber K, et al. (eds). TMS: Warrendale, PA, 2003; 43.
- (2003) Electron Microscopy: Its Role in Materials Research - The Mike Meshii Symposium , pp. 43
- Sudbrack, C.K.¹ Yoon, K.E.² Mao, Z.³ Noebe, R.D.⁴ Isheim, D.⁵ Seidman, D.N.⁶

10
- 0035521964
- Yoon KE, Isheim D, Noebe RD, Seidman DN. Interface Sci. 2001; 9: 249.
- (2001) Interface Sci. , vol.9 , pp. 249
- Yoon, K.E.¹ Isheim, D.² Noebe, R.D.³ Seidman, D.N.⁴

11
- 0004176766
- Oxford University Press: Oxford
- Sutton AP, Balluffi RW. Interfaces in Crystalline Materials. Oxford University Press: Oxford, 1996; 358.
- (1996) Interfaces in Crystalline Materials , pp. 358
- Sutton, A.P.¹ Balluffi, R.W.²

12
- 0037090029
- Hellman OC, Seidman DN. Mater. Sci. Eng. A 2002; 327: 24.
- (2002) Mater. Sci. Eng. A , vol.327 , pp. 24
- Hellman, O.C.¹ Seidman, D.N.²

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