Fault Tolerant Four-State Logic by Using Self-Healing Cells

26th IEEE International Conference on Computer Design 2008, ICCD

Volumn , Issue , 2008, Pages 1-6

  Panhofer, Thomas ^a   Friesenbichler, Werner ^a   Delvai, Martin ^b  

^a RUAG Aerospace Austria GmbH   (Austria)

^b VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

DEADLOCK DETECTIONS; ERROR-PRONE; FAULT-TOLERANT; FEATURE SIZES; HIGH RELIABILITIES; HIGHER INTEGRATIONS; MULTIPLE FAULTS; OPERATING SPEED; SELF-HEALING; SPACE MISSIONS; SUPPLY VOLTAGES; TEMPORAL REDUNDANCIES;

DIGITAL INTEGRATED CIRCUITS; ERROR DETECTION; FAULT TOLERANCE; INTEGRATED CIRCUITS; QUALITY ASSURANCE;

LOGIC CIRCUITS;

EID: 78650422021     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICCD.2008.4751832     Document Type: Conference Paper

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